Abstract— In the present paper, we have reported theroom temperature growth of antimony sulphide (Sb2S3) thinfilms by dip method and detailed characterization of these films. The filmswere deposited from a reaction bath containing antimony chloride, glycine andsodium thiosulphate. We have analyzed the structure, morphology, compositionproperties of annealed Sb2S3 thin films. X-raydiffraction pattern showed that the films were polycrystalline. Scanningmicroscopy (SEM) study shows, size of the sphere gets increased as theannealing temperature increases. The globular grains are merged with oneanother. Composition analyses by EDAXshow that the films are nearly stiochiometric in composition.
Keywords: Thin films; X-ray diffraction; EDAX, Surfacemorphology.