Abstract

Abstract—Copper doped cadmium selenide thin films with variable composition 0.01-1 mol%have been grown on non-conducting glass substrate by dip coating technique. Theeffect of doping has been investigate. X-ray diffraction optical absorption microscopytechniques were used to characterize the films. The X-ray diffraction studyindicates all the films were crystalline in hexagonal structure. Examination ofabsorption spectra suggests direct kind of band gap, the magnitude of whichvaries non-linearly as copper content in the film increases. The grain sizeincreases up to 0.1 mol% and afterwards decreases.

Keywords: Thin films, X-ray diffraction, doping